Sule Ozev

Ozev_SuleWEBAssociate Professor
ASU Directory Profile

GWC 311
480-727-7547
sule.ozev@asu.edu

Research expertise
Self-test and self-calibration for wireless transceivers, analysis and mitigation of process variations for mixed signal and digital circuits, fault-tolerant and reconfigurable heterogeneous systems, mixed signal circuit testing

Sule Ozev received her BS degree in electrical engineering from Bogazici University, Turkey, and her MS. and PhD degrees in computer science and engineering from University of California, San Diego in 1995, 1998, and 2002, respectively. Ozev joined the electrical engineering faculty in August of 2008 and is currently an associate professor. She is an associate editor for IEEE Transactions on VLSI systems and serves on various program committees, including IEEE VLSI Test Symposium (2008-2010), IEEE/ACM Design Automation Conference (2007-2009), IEEE Test Conference (2007-2010), IEEE International Conference on Computer Design (2004-2010), and IEEE European Test Symposium (2006-2010). She was the general chair for IEEE International Mixed-Signals, Sensors, and Systems 2009. In 2006, Ozev received the NSF CAREER Award. She has published over 70 conference and journal papers and holds one U.S. patent.

Professional preparation
Ph.D., computer science and engineering, University of California, San Diego, 2002
M.S., computer science and engineering, University of California, San Diego, 1998
B.S., electrical engineering, Bogazici University, Turkey, 1995

Recognition and awards
Best paper award in European Test Symposium, 2009
IBM Faculty Award, 2007
NSF CAREER award, 2006
Best paper award, ICCD, 2005
Best Dissertation Award, University of California, San Diego, 2003
VLSI Test Symposium TTTC Naveena Nagi Award, 2002
IBM Corporation Co-operative Fellowship Award, 2000-2002
UCSD Flaviu Cristian Research Award, 1999-2001

Selected Publications
E. Acar and S. Ozev, “Low Cost MIMO Testing for RF Integrated Circuits”, in IEEE Transactions on VLSI Systems, 2010.

E. S. Erdogan and S. Ozev, “Detailed Characterization of Transceiver Parameters Through Loop-Back-Based BiST”, in IEEE Transactions on VLSI Systems, 2010.

E. Acar, S. Ozev, “Low-Cost Characterization and Calibration of RF Integrated Circuits through I–Q Data Analysis,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 28, issue 7, 993- 1005, July 2009.

E. Yilmaz and S. Ozev, “Accurate Multi-Specification DPPM Estimation Using Layered Sampling Based Simulation”, IEEE International Symposium on Quality Electronic Design, 2010.

E. Yilmaz, A. Nassery, E. Acar, and S. Ozev, “Built-in EVM Measurement for OFDM Transcievers Using All-digital DFT”, in IEEE International Test Conference, November 2009.

E. Yilmaz and S. Ozev, “Defect-Based Test Optimization for Analog/RF Circuits for Near-Zero DPPM Applications”, in IEEE International Conference on Computer Design, October 2009.

E. Yilmaz and S. Ozev, “Adaptive test elimination for analog/RF circuits”, in IEEE/ACM Design Automation Conference, June 2009, Page(s):720 – 725.