Professor Sule Ozev won the IEEE VLSI Test Symposium 2022 Best Paper Award for “Fast RF Mismatch Calibration Using Built-in Detectors,” which she wrote with Qualcomm Senior Engineer and former Arizona State University Research Assistant Müslüm Emir Avcı and Texas Instruments’ Y.B. Chethan Kumar. The award was given at the 2023 symposium after the paper’s presentation at the 2022 event.